Automated Test Scenario Selection Based on Levenshtein Distance - researchr publication authors

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Sapna P. G., Hrushikesha Mohanty. Automated Test Scenario Selection Based on Levenshtein Distance. In Tomasz Janowski, Hrushikesha Mohanty, editors, Distributed Computing and Internet Technology, 6th International Conference, ICDCIT 2010, Bhubaneswar, India, February 15-17, 2010. Proceedings. Volume 5966 of Lecture Notes in Computer Science, pages 255-266, Springer, 2010. [doi]

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