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Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies

Donald A. Gajewski, Satyaki Ganguly, Scott Sheppard, Simon Wood, Jeff B. Barner, Jim Milligan, John Palmour. Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies. Microelectronics Reliability, 84:1-6, 2018. [doi]

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Donald A. Gajewski

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Satyaki Ganguly

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Scott Sheppard

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Simon Wood

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Jeff B. Barner

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Jim Milligan

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John Palmour

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