John F. Galantowicz. Metrics for the quality of footprint-matched passive microwave measurements. In IGARSS 2004. 2004 IEEE International Geoscience and Remote Sensing Symposium, Anchorage, Alaska, USA, 20-24 September 2004. pages 3763-3766, IEEE, 2004. [doi]
@inproceedings{Galantowicz04,
title = {Metrics for the quality of footprint-matched passive microwave measurements},
author = {John F. Galantowicz},
year = {2004},
doi = {10.1109/IGARSS.2004.1369941},
url = {http://dx.doi.org/10.1109/IGARSS.2004.1369941},
researchr = {https://researchr.org/publication/Galantowicz04},
cites = {0},
citedby = {0},
pages = {3763-3766},
booktitle = {IGARSS 2004. 2004 IEEE International Geoscience and Remote Sensing Symposium, Anchorage, Alaska, USA, 20-24 September 2004},
publisher = {IEEE},
isbn = {0-7803-8742-2},
}