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Michael G. Gallup, William Ledbetter Jr., Ralph McGarity, Steve McMahan, Kenneth Scheuer, Clark G. Shepard, Lal Sood. Testability features of the 68040. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 749-757, IEEE Computer Society, 1990. [doi]

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