Local recovery and failure masking for stencil-based applications at extreme scales

Marc Gamell, Keita Teranishi, Michael A. Heroux, Jackson Mayo, Hemanth Kolla, Jacqueline Chen, Manish Parashar. Local recovery and failure masking for stencil-based applications at extreme scales. In Jackie Kern, Jeffrey S. Vetter, editors, Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, SC 2015, Austin, TX, USA, November 15-20, 2015. pages 70, ACM, 2015. [doi]

Authors

Marc Gamell

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Keita Teranishi

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Michael A. Heroux

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Jackson Mayo

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Hemanth Kolla

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Jacqueline Chen

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Manish Parashar

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