Maohua Gan, Zeynep Yücel, Akito Monden. Neg/pos-Normalized Accuracy Measures for Software Defect Prediction. IEEE Access, 10:134580-134591, 2022. [doi]
@article{GanYM22a,
title = {Neg/pos-Normalized Accuracy Measures for Software Defect Prediction},
author = {Maohua Gan and Zeynep Yücel and Akito Monden},
year = {2022},
doi = {10.1109/ACCESS.2022.3232144},
url = {https://doi.org/10.1109/ACCESS.2022.3232144},
researchr = {https://researchr.org/publication/GanYM22a},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {10},
pages = {134580-134591},
}