Frank Gao. High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications. Microelectronics Reliability, 43(6):829-837, 2003. [doi]
@article{Gao03-1,
title = {High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications},
author = {Frank Gao},
year = {2003},
doi = {10.1016/S0026-2714(03)00067-2},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00067-2},
tags = {reliability},
researchr = {https://researchr.org/publication/Gao03-1},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {6},
pages = {829-837},
}