PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization

Liming Gao, Christian Burmer. PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization. Microelectronics Reliability, 48(8-9):1349-1353, 2008. [doi]

Authors

Liming Gao

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Christian Burmer

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