A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology

Huijun Gao, Wanxin Jin, Xianqiang Yang, Okyay Kaynak. A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology. IEEE Transactions on Industrial Electronics, 64(4):3030-3038, 2017. [doi]

@article{GaoJYK17,
  title = {A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology},
  author = {Huijun Gao and Wanxin Jin and Xianqiang Yang and Okyay Kaynak},
  year = {2017},
  doi = {10.1109/TIE.2016.2643600},
  url = {http://dx.doi.org/10.1109/TIE.2016.2643600},
  researchr = {https://researchr.org/publication/GaoJYK17},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {64},
  number = {4},
  pages = {3030-3038},
}