Yan Gao, Yiqun Li. Improving Gaussian Process Classification with Outlier Detection, with Applications in Image Classification. In Ron Kimmel, Reinhard Klette, Akihiro Sugimoto, editors, Computer Vision - ACCV 2010 - 10th Asian Conference on Computer Vision, Queenstown, New Zealand, November 8-12, 2010, Revised Selected Papers, Part IV. Volume 6495 of Lecture Notes in Computer Science, pages 153-164, Springer, 2010. [doi]
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