Xiufeng Gao, Stan Z. Li, Rong Liu, Peiren Zhang. Standardization of Face Image Sample Quality. In Seong-Whan Lee, Stan Z. Li, editors, Advances in Biometrics, International Conference, ICB 2007, Seoul, Korea, August 27-29, 2007, Proceedings. Volume 4642 of Lecture Notes in Computer Science, pages 242-251, Springer, 2007. [doi]
@inproceedings{GaoLLZ07, title = {Standardization of Face Image Sample Quality}, author = {Xiufeng Gao and Stan Z. Li and Rong Liu and Peiren Zhang}, year = {2007}, doi = {10.1007/978-3-540-74549-5_26}, url = {http://dx.doi.org/10.1007/978-3-540-74549-5_26}, researchr = {https://researchr.org/publication/GaoLLZ07}, cites = {0}, citedby = {0}, pages = {242-251}, booktitle = {Advances in Biometrics, International Conference, ICB 2007, Seoul, Korea, August 27-29, 2007, Proceedings}, editor = {Seong-Whan Lee and Stan Z. Li}, volume = {4642}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-540-74548-8}, }