Winston García-Gabin, Erik Berglund, Huang Zhang, Kateryna Mishchenko, Xiaojing Zhang. A data center model for testing control and optimization algorithms. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 7165-7170, IEEE, 2017. [doi]
@inproceedings{Garcia-GabinBZM17,
title = {A data center model for testing control and optimization algorithms},
author = {Winston García-Gabin and Erik Berglund and Huang Zhang and Kateryna Mishchenko and Xiaojing Zhang},
year = {2017},
doi = {10.1109/IECON.2017.8217254},
url = {https://doi.org/10.1109/IECON.2017.8217254},
researchr = {https://researchr.org/publication/Garcia-GabinBZM17},
cites = {0},
citedby = {0},
pages = {7165-7170},
booktitle = {IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017},
publisher = {IEEE},
isbn = {978-1-5386-1127-2},
}