Jose Luis Garcia-Gervacio, Alejandro Nocua, Víctor H. Champac. Screening small-delay defects using inter-path correlation to reduce reliability risk. Microelectronics Reliability, 55(6):1005-1011, 2015. [doi]
@article{Garcia-Gervacio15,
title = {Screening small-delay defects using inter-path correlation to reduce reliability risk},
author = {Jose Luis Garcia-Gervacio and Alejandro Nocua and Víctor H. Champac},
year = {2015},
doi = {10.1016/j.microrel.2015.03.007},
url = {http://dx.doi.org/10.1016/j.microrel.2015.03.007},
researchr = {https://researchr.org/publication/Garcia-Gervacio15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {6},
pages = {1005-1011},
}