Paulo Garcia, T. Gomes, F. Salgado, Paulo Cardoso, Jorge Cabral, Mongkol Ekpanyapong. Reliability correlation between physical and virtual cores at the ISA level. In Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation, ETFA 2012, Krakow, Poland, September 17-21, 2012. pages 1-4, IEEE, 2012. [doi]
@inproceedings{GarciaGSCCE12,
title = {Reliability correlation between physical and virtual cores at the ISA level},
author = {Paulo Garcia and T. Gomes and F. Salgado and Paulo Cardoso and Jorge Cabral and Mongkol Ekpanyapong},
year = {2012},
doi = {10.1109/ETFA.2012.6489725},
url = {http://dx.doi.org/10.1109/ETFA.2012.6489725},
researchr = {https://researchr.org/publication/GarciaGSCCE12},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation, ETFA 2012, Krakow, Poland, September 17-21, 2012},
publisher = {IEEE},
isbn = {978-1-4673-4735-8},
}