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Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors

Xavier Garros, Antoine Laurent, Alexandre Subirats, X. Federspiel, E. Vincent, Gilles Reimbold. Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors. Microelectronics Reliability, 80:100-108, 2018. [doi]

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Xavier Garros

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Antoine Laurent

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Alexandre Subirats

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X. Federspiel

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E. Vincent

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Gilles Reimbold

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