Umberto Gatti, Cristiano Calligaro, Evgeny Pikhay, Yakov Roizin. Radiation-hardened techniques for CMOS flash ADC. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{GattiCPR14,
title = {Radiation-hardened techniques for CMOS flash ADC},
author = {Umberto Gatti and Cristiano Calligaro and Evgeny Pikhay and Yakov Roizin},
year = {2014},
doi = {10.1109/ICECS.2014.7049906},
url = {http://dx.doi.org/10.1109/ICECS.2014.7049906},
researchr = {https://researchr.org/publication/GattiCPR14},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4242-8},
}