Rajni Gautam, Manoj Saxena, R. S. Gupta, Mridula Gupta. Effect of localised charges on nanoscale cylindrical surrounding gate MOSFET: Analog performance and linearity analysis. Microelectronics Reliability, 52(6):989-994, 2012. [doi]
@article{GautamSGG12,
title = {Effect of localised charges on nanoscale cylindrical surrounding gate MOSFET: Analog performance and linearity analysis},
author = {Rajni Gautam and Manoj Saxena and R. S. Gupta and Mridula Gupta},
year = {2012},
doi = {10.1016/j.microrel.2011.12.014},
url = {http://dx.doi.org/10.1016/j.microrel.2011.12.014},
researchr = {https://researchr.org/publication/GautamSGG12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {6},
pages = {989-994},
}