Rajni Gautam, Manoj Saxena, R. S. Gupta, Mridula Gupta. Numerical analysis of localised charges impact on static and dynamic performance of nanoscale cylindrical surrounding gate MOSFET based CMOS inverter. Microelectronics Reliability, 53(2):236-244, 2013. [doi]
@article{GautamSGG13,
title = {Numerical analysis of localised charges impact on static and dynamic performance of nanoscale cylindrical surrounding gate MOSFET based CMOS inverter},
author = {Rajni Gautam and Manoj Saxena and R. S. Gupta and Mridula Gupta},
year = {2013},
doi = {10.1016/j.microrel.2012.08.009},
url = {http://dx.doi.org/10.1016/j.microrel.2012.08.009},
researchr = {https://researchr.org/publication/GautamSGG13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {2},
pages = {236-244},
}