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Temperature dependent subthreshold model of long channel GAA MOSFET including localized charges to study variations in its temperature sensitivity

Rajni Gautam, Manoj Saxena, R. S. Gupta, Mridula Gupta. Temperature dependent subthreshold model of long channel GAA MOSFET including localized charges to study variations in its temperature sensitivity. Microelectronics Reliability, 54(1):37-43, 2014. [doi]

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Rajni Gautam

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Manoj Saxena

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R. S. Gupta

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Mridula Gupta

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