Jiuhao Ge, Baowang Hu, Chenkai Yang, Fan-Wei Yu, Noritaka Yusa. Surface Profile Reconstruction of Complex Cracks Using the Signals of Rotating Eddy Current Testing Through the Eddy Current Imaging Method. IEEE Transactions on Industrial Electronics, 70(9):9632-9641, September 2023. [doi]
@article{GeHYYY23,
title = {Surface Profile Reconstruction of Complex Cracks Using the Signals of Rotating Eddy Current Testing Through the Eddy Current Imaging Method},
author = {Jiuhao Ge and Baowang Hu and Chenkai Yang and Fan-Wei Yu and Noritaka Yusa},
year = {2023},
month = {September},
doi = {10.1109/TIE.2022.3206746},
url = {https://doi.org/10.1109/TIE.2022.3206746},
researchr = {https://researchr.org/publication/GeHYYY23},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {70},
number = {9},
pages = {9632-9641},
}