Knowledge-based linguistic equations for defect detection through functional testing of printed circuit boards

Sébastien Gebus, Esko Juuso, Kauko Leiviskä. Knowledge-based linguistic equations for defect detection through functional testing of printed circuit boards. Expert Syst. Appl., 36(1):292-302, 2009. [doi]

Authors

Sébastien Gebus

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Esko Juuso

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Kauko Leiviskä

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