Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip

Kiran George, Chien-In Henry Chen. Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip. IEEE T. Instrumentation and Measurement, 58(5):1495-1504, 2009. [doi]

Authors

Kiran George

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Chien-In Henry Chen

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