Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini. Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectronics Reliability, 46(9-11):1669-1672, 2006. [doi]
@article{GerardinGCPG06,
title = {Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress},
author = {Simone Gerardin and A. Griffoni and A. Cester and Alessandro Paccagnella and G. Ghidini},
year = {2006},
doi = {10.1016/j.microrel.2006.07.052},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.052},
researchr = {https://researchr.org/publication/GerardinGCPG06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1669-1672},
}