L. Gerrer, M. Rafik, G. Ribes, G. Ghibaudo, E. Vincent. Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation. Microelectronics Reliability, 50(9-11):1259-1262, 2010. [doi]
@article{GerrerRRGV10,
title = {Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation},
author = {L. Gerrer and M. Rafik and G. Ribes and G. Ghibaudo and E. Vincent},
year = {2010},
doi = {10.1016/j.microrel.2010.07.143},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.143},
tags = {e-science},
researchr = {https://researchr.org/publication/GerrerRRGV10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1259-1262},
}