Test: The New Value-Added Field

Aart J. de Geus. Test: The New Value-Added Field. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 12, IEEE Computer Society, 1994.

Authors

Aart J. de Geus

This author has not been identified. Look up 'Aart J. de Geus' in Google