On Constant Depth Circuits Parameterized by Degree: Identity Testing and Depth Reduction - researchr publication authors

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Purnata Ghosal, Om Prakash, B. V. Raghavendra Rao. On Constant Depth Circuits Parameterized by Degree: Identity Testing and Depth Reduction. In Yixin Cao 0001, Jianer Chen, editors, Computing and Combinatorics - 23rd International Conference, COCOON 2017, Hong Kong, China, August 3-5, 2017, Proceedings. Volume 10392 of Lecture Notes in Computer Science, pages 250-261, Springer, 2017. [doi]

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