Pallabi Ghosh, Aritra Bhattacharya, Domenic Forte, Rajat Subhra Chakraborty. Automated Defective Pin Detection for Recycled Microelectronics Identification. J. Hardware and Systems Security, 3(3):250-260, 2019. [doi]
@article{GhoshBFC19,
title = {Automated Defective Pin Detection for Recycled Microelectronics Identification},
author = {Pallabi Ghosh and Aritra Bhattacharya and Domenic Forte and Rajat Subhra Chakraborty},
year = {2019},
doi = {10.1007/s41635-019-00069-7},
url = {https://doi.org/10.1007/s41635-019-00069-7},
researchr = {https://researchr.org/publication/GhoshBFC19},
cites = {0},
citedby = {0},
journal = {J. Hardware and Systems Security},
volume = {3},
number = {3},
pages = {250-260},
}