Soumajit Ghosh, Mitiko Miura-Mattausch, Takahiro Iizuka, Hideyuki Kikuchihara, Hafizur Rahaman 0001, Hans Jürgen Mattausch. History Effect on Circuit Performance of SOI-MOSFETs. In 3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020, Howrah, India, March 4-6, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{GhoshMIKRM20,
title = {History Effect on Circuit Performance of SOI-MOSFETs},
author = {Soumajit Ghosh and Mitiko Miura-Mattausch and Takahiro Iizuka and Hideyuki Kikuchihara and Hafizur Rahaman 0001 and Hans Jürgen Mattausch},
year = {2020},
doi = {10.1109/ISDCS49393.2020.9262980},
url = {https://doi.org/10.1109/ISDCS49393.2020.9262980},
researchr = {https://researchr.org/publication/GhoshMIKRM20},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020, Howrah, India, March 4-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6564-6},
}