C. Gil, Peter Ersland, A. Li. Determining DC/RF survivability limits of GaAs semiconductor circuits. Microelectronics Reliability, 49(5):484-487, 2009. [doi]
@article{GilEL09,
title = {Determining DC/RF survivability limits of GaAs semiconductor circuits},
author = {C. Gil and Peter Ersland and A. Li},
year = {2009},
doi = {10.1016/j.microrel.2009.02.004},
url = {http://dx.doi.org/10.1016/j.microrel.2009.02.004},
tags = {C++},
researchr = {https://researchr.org/publication/GilEL09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {5},
pages = {484-487},
}