Monte Carlo Localization Using SIFT Features

Arturo Gil, Óscar Reinoso, Maria Asunción Vicente, César Fernández Peris, Luis Payá. Monte Carlo Localization Using SIFT Features. In Jorge S. Marques, Nicolas Pérez de la Blanca, Pedro Pina, editors, Pattern Recognition and Image Analysis, Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part I. Volume 3522 of Lecture Notes in Computer Science, pages 623-630, Springer, 2005. [doi]

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