Power Analysis Resilient SRAM Design Implemented with a 1% Area Overhead Impedance Randomization Unit for Security Applications

Robert Giterman, Maoz Wicentowski, Oron Chertkow, Ilan Sever, Ishai Kehati, Yoav Weizman, Osnat Keren, Alexander Fish. Power Analysis Resilient SRAM Design Implemented with a 1% Area Overhead Impedance Randomization Unit for Security Applications. In 45th IEEE European Solid State Circuits Conference, ESSCIRC 2019, Cracow, Poland, September 23-26, 2019. pages 69-72, IEEE, 2019. [doi]

@inproceedings{GitermanWCSKWKF19,
  title = {Power Analysis Resilient SRAM Design Implemented with a 1% Area Overhead Impedance Randomization Unit for Security Applications},
  author = {Robert Giterman and Maoz Wicentowski and Oron Chertkow and Ilan Sever and Ishai Kehati and Yoav Weizman and Osnat Keren and Alexander Fish},
  year = {2019},
  doi = {10.1109/ESSCIRC.2019.8902622},
  url = {https://doi.org/10.1109/ESSCIRC.2019.8902622},
  researchr = {https://researchr.org/publication/GitermanWCSKWKF19},
  cites = {0},
  citedby = {0},
  pages = {69-72},
  booktitle = {45th IEEE European Solid State Circuits Conference, ESSCIRC 2019, Cracow, Poland, September 23-26, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1550-4},
}