Parallelizing a Defect Detection and Categorization Application

Leonid Glimcher, Gagan Agrawal, Sameep Mehta, Ruoming Jin, Raghu Machiraju. Parallelizing a Defect Detection and Categorization Application. In 19th International Parallel and Distributed Processing Symposium (IPDPS 2005), CD-ROM / Abstracts Proceedings, 4-8 April 2005, Denver, CA, USA. IEEE Computer Society, 2005. [doi]

@inproceedings{GlimcherAMJM05,
  title = {Parallelizing a Defect Detection and Categorization Application},
  author = {Leonid Glimcher and Gagan Agrawal and Sameep Mehta and Ruoming Jin and Raghu Machiraju},
  year = {2005},
  doi = {10.1109/IPDPS.2005.332},
  url = {http://doi.ieeecomputersociety.org/10.1109/IPDPS.2005.332},
  researchr = {https://researchr.org/publication/GlimcherAMJM05},
  cites = {0},
  citedby = {0},
  booktitle = {19th International Parallel and Distributed Processing Symposium (IPDPS 2005), CD-ROM / Abstracts Proceedings, 4-8 April 2005, Denver, CA, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2312-9},
}