Nightmare at test time: robust learning by feature deletion

Amir Globerson, Sam T. Roweis. Nightmare at test time: robust learning by feature deletion. In William W. Cohen, Andrew Moore, editors, Machine Learning, Proceedings of the Twenty-Third International Conference (ICML 2006), Pittsburgh, Pennsylvania, USA, June 25-29, 2006. Volume 148 of ACM International Conference Proceeding Series, pages 353-360, ACM, 2006. [doi]

Authors

Amir Globerson

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Sam T. Roweis

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