Robust Process Discovery with Artificial Negative Events

Stijn Goedertier, David Martens, Jan Vanthienen, Bart Baesens. Robust Process Discovery with Artificial Negative Events. Journal of Machine Learning Research, 10:1305-1340, 2009. [doi]

Authors

Stijn Goedertier

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David Martens

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Jan Vanthienen

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Bart Baesens

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