REad/access-preferred (REAP) SRAM - architecture-aware bit cell design for improved yield and lower VMIN - researchr publication authors

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Ashish Goel, Patrick Ndai, Jaydeep P. Kulkarni, Kaushik Roy. REad/access-preferred (REAP) SRAM - architecture-aware bit cell design for improved yield and lower VMIN. In IEEE Custom Integrated Circuits Conference, CICC 2009, San Jose, California, USA, 13-16 September, 2009, Proceedings. pages 503-506, IEEE, 2009. [doi]

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