Swapna S. Gokhale, Robert E. Mullen. From Test Count to Code Coverage using the Lognormal Failure Rate. In 15th International Symposium on Software Reliability Engineering (ISSRE 2004), 2-5 November 2004, Saint-Malo, Bretagne, France. pages 295-305, IEEE Computer Society, 2004. [doi]
@inproceedings{GokhaleM04, title = {From Test Count to Code Coverage using the Lognormal Failure Rate}, author = {Swapna S. Gokhale and Robert E. Mullen}, year = {2004}, doi = {10.1109/ISSRE.2004.20}, url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.2004.20}, tags = {test coverage, testing, e-science, coverage}, researchr = {https://researchr.org/publication/GokhaleM04}, cites = {0}, citedby = {0}, pages = {295-305}, booktitle = {15th International Symposium on Software Reliability Engineering (ISSRE 2004), 2-5 November 2004, Saint-Malo, Bretagne, France}, publisher = {IEEE Computer Society}, isbn = {0-7695-2215-7}, }