CLEAN-ECC: high reliability ECC for adaptive granularity memory system

Seong-Lyong Gong, Minsoo Rhu, Jungrae Kim, Jinsuk Chung, Mattan Erez. CLEAN-ECC: high reliability ECC for adaptive granularity memory system. In Milos Prvulovic, editor, Proceedings of the 48th International Symposium on Microarchitecture, MICRO 2015, Waikiki, HI, USA, December 5-9, 2015. pages 611-622, ACM, 2015. [doi]

@inproceedings{GongRKCE15,
  title = {CLEAN-ECC: high reliability ECC for adaptive granularity memory system},
  author = {Seong-Lyong Gong and Minsoo Rhu and Jungrae Kim and Jinsuk Chung and Mattan Erez},
  year = {2015},
  doi = {10.1145/2830772.2830799},
  url = {http://doi.acm.org/10.1145/2830772.2830799},
  researchr = {https://researchr.org/publication/GongRKCE15},
  cites = {0},
  citedby = {0},
  pages = {611-622},
  booktitle = {Proceedings of the 48th International Symposium on Microarchitecture, MICRO 2015, Waikiki, HI, USA, December 5-9, 2015},
  editor = {Milos Prvulovic},
  publisher = {ACM},
  isbn = {978-1-4503-4034-2},
}