Graham C. Goodwin, Juan I. Yuz, Juan C. Agüero, Mauricio Esteban Cea Garrido. Sampling and sampled-data models. In American Control Conference, ACC 2010, Baltimore, Maryland, USA, June 30 - July 2, 2010. pages 1-20, IEEE, 2010. [doi]
@inproceedings{GoodwinYAG10,
title = {Sampling and sampled-data models},
author = {Graham C. Goodwin and Juan I. Yuz and Juan C. Agüero and Mauricio Esteban Cea Garrido},
year = {2010},
url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5531562},
researchr = {https://researchr.org/publication/GoodwinYAG10},
cites = {0},
citedby = {0},
pages = {1-20},
booktitle = {American Control Conference, ACC 2010, Baltimore, Maryland, USA, June 30 - July 2, 2010},
publisher = {IEEE},
isbn = {978-1-4244-7427-1},
}