Ad J. Van de Goor, Aad Offerman, Ivo Schanstra. Towards a Uniform Notation for Memory Tests. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 420-427, IEEE Computer Society, 1996. [doi]
@inproceedings{GoorOS96,
title = {Towards a Uniform Notation for Memory Tests},
author = {Ad J. Van de Goor and Aad Offerman and Ivo Schanstra},
year = {1996},
doi = {10.1109/EDTC.1996.494335},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494335},
researchr = {https://researchr.org/publication/GoorOS96},
cites = {0},
citedby = {0},
pages = {420-427},
booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996},
publisher = {IEEE Computer Society},
isbn = {0-8186-7423-7},
}