A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates - researchr publication authors

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Manoj Kumar Goparaju, Spyros Tragoudas. A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 323-328, IEEE Computer Society, 2008. [doi]

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