Krzysztof Górecki, Pawel Górecki. The dc measurement method of thermal resistance of IGBTs. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 333-337, IEEE, 2013. [doi]
@inproceedings{GoreckiG13,
title = {The dc measurement method of thermal resistance of IGBTs},
author = {Krzysztof Górecki and Pawel Górecki},
year = {2013},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6613368},
researchr = {https://researchr.org/publication/GoreckiG13},
cites = {0},
citedby = {0},
pages = {333-337},
booktitle = {Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013},
publisher = {IEEE},
}