Functional and catastrophic thermal failures in bipolar electronic circuits

Krzysztof Górecki, Witold J. Stepowicz, Janusz Zarebski. Functional and catastrophic thermal failures in bipolar electronic circuits. In 12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005. pages 1-4, IEEE, 2005. [doi]

@inproceedings{GoreckiSZ05,
  title = {Functional and catastrophic thermal failures in bipolar electronic circuits},
  author = {Krzysztof Górecki and Witold J. Stepowicz and Janusz Zarebski},
  year = {2005},
  doi = {10.1109/ICECS.2005.4633593},
  url = {http://dx.doi.org/10.1109/ICECS.2005.4633593},
  researchr = {https://researchr.org/publication/GoreckiSZ05},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {12th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2005, Gammarth, Tunisia, December 11-14, 2005},
  publisher = {IEEE},
  isbn = {978-9972-61-100-1},
}