Winfried Görke. Testmöglichkeiten für LSI-Schaltkreise. it - Information Technology, 20(5):220-227, 1978.
@article{Gorke78,
title = {Testmöglichkeiten für LSI-Schaltkreise},
author = {Winfried Görke},
year = {1978},
researchr = {https://researchr.org/publication/Gorke78},
cites = {0},
citedby = {0},
journal = {it - Information Technology},
volume = {20},
number = {5},
pages = {220-227},
}