Kevin Gorman, Michael Roberge, Adrian Paparelli, Gary Pomichter, Stephen Sliva, William Corbin. Advancements in at-speed array BIST: multiple improvements. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
@inproceedings{GormanRPPSC07,
title = {Advancements in at-speed array BIST: multiple improvements},
author = {Kevin Gorman and Michael Roberge and Adrian Paparelli and Gary Pomichter and Stephen Sliva and William Corbin},
year = {2007},
doi = {10.1109/TEST.2007.4437566},
url = {http://dx.doi.org/10.1109/TEST.2007.4437566},
researchr = {https://researchr.org/publication/GormanRPPSC07},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}