Monitoring BIST by covers

Michael Gössel, Helmut Jürgensen. Monitoring BIST by covers. In Proceedings of the European Design Automation Conference 1993, EURO-DAC '93 with EURO-VHDL'93, Hamburg, Germany, September 20-24, 1993. pages 208-213, IEEE Computer Society, 1993. [doi]

@inproceedings{GosselJ93,
  title = {Monitoring BIST by covers},
  author = {Michael Gössel and Helmut Jürgensen},
  year = {1993},
  doi = {10.1109/EURDAC.1993.410639},
  url = {http://dx.doi.org/10.1109/EURDAC.1993.410639},
  researchr = {https://researchr.org/publication/GosselJ93},
  cites = {0},
  citedby = {0},
  pages = {208-213},
  booktitle = {Proceedings of the European Design Automation Conference 1993, EURO-DAC '93 with EURO-VHDL'93, Hamburg, Germany, September 20-24, 1993},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-4350-1},
}