Yating Gou, Jiachen Tian, Kefan Yu, Cuicui Liu, Fang Zhuo, Feng Wang, Jiarui Zhang. Reliability Modeling and Assessment of Dual Active Bridge Based DC Transformer for DC Power Distribution Application. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 6773-6778, IEEE, 2019. [doi]
@inproceedings{GouTYLZWZ19,
title = {Reliability Modeling and Assessment of Dual Active Bridge Based DC Transformer for DC Power Distribution Application},
author = {Yating Gou and Jiachen Tian and Kefan Yu and Cuicui Liu and Fang Zhuo and Feng Wang and Jiarui Zhang},
year = {2019},
doi = {10.1109/IECON.2019.8927019},
url = {https://doi.org/10.1109/IECON.2019.8927019},
researchr = {https://researchr.org/publication/GouTYLZWZ19},
cites = {0},
citedby = {0},
pages = {6773-6778},
booktitle = {IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4878-6},
}