Comprehensive Analysis of Harmonic Signature Resulting from Open Switch Fault in Interleaved Boost Converter

Abdelmadjid Gouichiche, Yacine Badaoui, Ahmed Safa, Abdelilah Chibani, Mohamed Benbouzid, Zakaria Chedjara. Comprehensive Analysis of Harmonic Signature Resulting from Open Switch Fault in Interleaved Boost Converter. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]

@inproceedings{GouichicheBSCBC21,
  title = {Comprehensive Analysis of Harmonic Signature Resulting from Open Switch Fault in Interleaved Boost Converter},
  author = {Abdelmadjid Gouichiche and Yacine Badaoui and Ahmed Safa and Abdelilah Chibani and Mohamed Benbouzid and Zakaria Chedjara},
  year = {2021},
  doi = {10.1109/IECON48115.2021.9589464},
  url = {https://doi.org/10.1109/IECON48115.2021.9589464},
  researchr = {https://researchr.org/publication/GouichicheBSCBC21},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-3554-3},
}