Johannes Grad, James E. Stine, David D. Neiman. Real World SOC Experience for the Classroom. In 2005 International Conference on Microelectronics Systems Education (MSE 2005), 12-13 June 2005, Anaheim, CA, USA. pages 49-50, IEEE Computer Society, 2005. [doi]
@inproceedings{GradSN05,
title = {Real World SOC Experience for the Classroom},
author = {Johannes Grad and James E. Stine and David D. Neiman},
year = {2005},
doi = {10.1109/MSE.2005.46},
url = {http://doi.ieeecomputersociety.org/10.1109/MSE.2005.46},
tags = {e-science},
researchr = {https://researchr.org/publication/GradSN05},
cites = {0},
citedby = {0},
pages = {49-50},
booktitle = {2005 International Conference on Microelectronics Systems Education (MSE 2005), 12-13 June 2005, Anaheim, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2374-9},
}