Michael Graef, Franziska Hain, Fabian Hosenfeld, Fabian Horst, Atieh Farokhnejad, Benjamín Iñíguez, Alexander Kloes. Analytical modeling of RDF effects on the threshold voltage in short-channel double-gate MOSFETs. In 24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017. pages 127-131, IEEE, 2017. [doi]
@inproceedings{GraefHHHFIK17,
title = {Analytical modeling of RDF effects on the threshold voltage in short-channel double-gate MOSFETs},
author = {Michael Graef and Franziska Hain and Fabian Hosenfeld and Fabian Horst and Atieh Farokhnejad and Benjamín Iñíguez and Alexander Kloes},
year = {2017},
doi = {10.23919/MIXDES.2017.8005168},
url = {https://doi.org/10.23919/MIXDES.2017.8005168},
researchr = {https://researchr.org/publication/GraefHHHFIK17},
cites = {0},
citedby = {0},
pages = {127-131},
booktitle = {24th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2017, Bydgoszcz, Poland, June 22-24, 2017},
publisher = {IEEE},
isbn = {978-83-63578-12-1},
}