Tibor Grasser. Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities. Microelectronics Reliability, 52(1):39-70, 2012. [doi]
@article{Grasser12,
title = {Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities},
author = {Tibor Grasser},
year = {2012},
doi = {10.1016/j.microrel.2011.09.002},
url = {http://dx.doi.org/10.1016/j.microrel.2011.09.002},
researchr = {https://researchr.org/publication/Grasser12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {1},
pages = {39-70},
}